X-ray diffraction (XRD)IntroductionX-ray diffraction analysis destructive to characterize crystalline materials. It provides information on structures, phases, preferred crystal orientations (texture), and other structural parameters such as average grain size, crystallinity, strains, and crystal defects. X-ray diffraction peaks are produced by constructive interference of a monochromatic beam of X-rays emitted at specific angles from each set of grating planes included in a sample. The maximum intensities are determined by the distribution of atoms inside the lattice. Therefore, the X-ray diffraction pattern is the fingerprint of the periodic atomic arrangement in a given material. Search for the base of standard ICDD data models. X-ray diffraction allows rapid identification phase in a large quantity of crystalline samples. X-ray diffraction is a useful technique for the non-destructive characterization of semiconductor heterostructures. S...